JSL - JITX Standard Library

This library is intended to be a companion library to the JITX environment. The goals for this project are:

1. Provide a focused API that supports PCB development.
2. Expressive, consistent interface that makes defining components and circuits easy.
3. Maintainable and distributable library with the help of SLM.
4. Well-documented and thoughtful explanations.

** This is currently in ALPHA release. **

Setup

1. If you are in the JITX VSCode environment:
   1. In Linux/Mac:
      1. which $SLM_STANZA
      2. $SLM_STANZA version
   2. In Windows Powershell:
      1. get-command $env:SLM_STANZA
      2. &$env:SLM_STANZA version
2. Outside the VSCode
   1. You need to have jstanza on the PATH.
   2. In Linux/Mac: which jstanza
   3. In Windows: get-command jstanza
   4. jstanza version should report the current version.
   5. If there is no jstanza on your path - then you will need to add it to your $PATH (or in Windows $env:PATH).

Running the Tests

To run the unit tests there are two make targets:

1. make tests - this will run all of the unit tests.
2. make test-<TAG> - this will run only the unit tests associated with the tag <TAG>

Example:

$> make test-SOIC
/Users/callendorph/.jitx/current/jstanza run-test jsl/tests/landpatterns/numbering ...  -tagged SOIC | grep -v "SKIP" | awk NF
[Test 21] test-lead
[PASS]
[Test 22] test-body
[PASS]
[Test 23] test-SOIC-N
[PASS]
[Test 24] test-SOIC-W
[PASS]
[Test 25] test-fine-pitch
[PASS]
[Test 26] test-thermal-lead
[PASS]
[Test 27] test-pad-numbering
[PASS]
[Test 28] test-error-handling
[PASS]
[Test 29] test-SOIC-with-pose
[PASS]
[Test 30] test-SOIC-with-rotation
[PASS]
[Test 31] test-thermal-lead-with-pose
[PASS]
Tests Finished: 11/111 tests passed. 100 tests skipped. 0 tests failed.
Longest Running Tests:
[PASS] test-SOIC-N (36 ms)
[PASS] test-fine-pitch (26 ms)
[PASS] test-SOIC-W (10 ms)
[PASS] test-thermal-lead (6181 us)
[PASS] test-thermal-lead-with-pose (5226 us)
[PASS] test-SOIC-with-pose (4847 us)
[PASS] test-pad-numbering (4547 us)
[PASS] test-error-handling (3561 us)
[PASS] test-SOIC-with-rotation (3531 us)
[PASS] test-lead (3124 us)
[PASS] test-body (561 us)